X-ray scattering applications using pulsed x-ray sources

Bennett C. Larson

doi:10.1117/12.331844

1 December 1998 X-ray scattering applications using pulsed x-ray sources

Bennett C. Larson

Proceedings Volume 3451, Time Structure of X-Ray Sources and Its Applications; (1998) https://doi.org/10.1117/12.331844
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

Pulsed x-ray sources have been used in transient structural phenomena investigations for over fifty years; however, until the advent of synchrotron sources and the development of table-top picosecond lasers, general access to high temporal resolution x-ray diffraction was relatively limited. Advances in diffraction techniques, sample excitation schemes, and detector systems, in addition to increased access to pulsed sources, have led to what is now a diverse and growing array of pulsed-source measurement applications. A survey of time- resolved investigations using pulsed x-ray sources is presented and research opportunities using both present and planned pulsed x-ray sources are discussed.

Citation Download Citation

Bennett C. Larson "X-ray scattering applications using pulsed x-ray sources", Proc. SPIE 3451, Time Structure of X-Ray Sources and Its Applications, (1 December 1998); https://doi.org/10.1117/12.331844

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