Paper
20 April 1998 Vacuum-thermal-deposited films of organic dyes as sensitive materials in electrodigit visualization processes
J. A. Zhizhenko, Vladimir Enokovich Agabekov, Yu. K. Mikhailovskii, E. V. Kotov
Author Affiliations +
Proceedings Volume 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997; (1998) https://doi.org/10.1117/12.306263
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1997, Kiev, Ukraine
Abstract
The method of electrodigit diagnostics is based on registration of a picture luminescence of object, placed in a high-frequency high-voltage field. It lets to reveal surface heterogeneity of a various nature, defects conductor under a layer optical opaque dielectric or in most dielectric. Early it is offered to replace traditionally used in this method halogensilver materials for vacuum thermal deposition (VTD) on dielectric of a substrate by thin layers organic dyes, that will make a method more technological and cheap. In the given work the spectral methods have qualitatively appreciated a role making of (electronic, x-ray, ultraviolet and visible radiations) in formation of the electrodigit image in VTD-films of Rhodamine 6G (R-6G) and dye of a class Oxazine (OX-1). It is established, that: (1) the contribution all making (except UV-radiation) in formation of a drawing in VTD-films of R-6G and OX-1 is insignificant; (2) the visible image in a VTD- film of R-6G will be formed for the account of decomposition of dye by `rigid' UV-radiation; (3) the influence of 1 sec. of the crown discharge on 0,68-micrometers a VTD-film of OX-1 is equivalent of irradiation her 365 nm by a doze 0,8 J/cm2.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. A. Zhizhenko, Vladimir Enokovich Agabekov, Yu. K. Mikhailovskii, and E. V. Kotov "Vacuum-thermal-deposited films of organic dyes as sensitive materials in electrodigit visualization processes", Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); https://doi.org/10.1117/12.306263
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Visible radiation

Dielectrics

Image processing

Visualization

X-rays

Absorption

Diagnostics

RELATED CONTENT

New CsI:Na-selenium x-ray detector
Proceedings of SPIE (May 06 2004)
Black fluorescent ink and applications
Proceedings of SPIE (February 09 2006)
Computer Quantitation Of Angiocardiographic Images
Proceedings of SPIE (June 19 1979)
Revealing pentimenti: the hidden history in a painting
Proceedings of SPIE (February 16 2007)

Back to Top