Paper
20 April 1998 Photoluminescence investigation of Dy incorporation into InP during liquid phase epitaxy
Balint Podor, Evgenie F. Venger, Tatyana Georgiyevn Kryshtab, Galina N. Semenova, Petro M. Lytvin, Mikhail P. Semtsiv
Author Affiliations +
Proceedings Volume 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997; (1998) https://doi.org/10.1117/12.306213
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1997, Kiev, Ukraine
Abstract
The low-temperature photoluminescence and x-ray structural investigations of the properties of InP epilayers grown from indium melt with rare earth element dysprosium (Dy) addition are presented. The Dy addition influence on intensity, linewidth and spectral position of the near-band-gap emission and of vacancy-impurity bands at 0.75 - 1.1 eV is reported. The obtained data of the stoichiometry changes in InP epilayers grown with addition of Dy are considered. Low background doping level with free electron concentration below about 1014 cm-3 at the room temperature for InP epilayers was achieved, that witnessed of the Dy strong gettering effect. It was also ascertained that Dy incorporated into the grown layers in various phases forms (like the inclusions) at lowest using concentration (CLDy approximately 0.01 at.%).
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Balint Podor, Evgenie F. Venger, Tatyana Georgiyevn Kryshtab, Galina N. Semenova, Petro M. Lytvin, and Mikhail P. Semtsiv "Photoluminescence investigation of Dy incorporation into InP during liquid phase epitaxy", Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); https://doi.org/10.1117/12.306213
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KEYWORDS
Dysprosium

Liquid phase epitaxy

Electrophoretic light scattering

Luminescence

Doping

Gallium arsenide

X-rays

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