SIM vs. SOS: a space interferometry trade study

Richard L. Baron; Mark H. Milman; Kim M. Aaron

doi:10.1117/12.317181

24 July 1998 SIM vs. SOS: a space interferometry trade study

Richard L. Baron, Mark H. Milman, Kim M. Aaron

Proceedings Volume 3350, Astronomical Interferometry; (1998) https://doi.org/10.1117/12.317181
Event: Astronomical Telescopes and Instrumentation, 1998, Kona, HI, United States

Abstract

This study was undertaken at the JPL to identify salient features of two competing instrument designs and to select the design that best meets the goals of the Space Interferometry Mission. Features were examined in terms of meeting performance, cost, schedule and risk requirements. The study included the spacecraft, the space environment, metrology considerations, stabilization of optics with temperature, spacecraft structure, complexity, and end-to- end testing among other items. The most significant determinant was the fundamental implementation of the instrument's metrology system. The impact on the testbed program associated with the mission was considered the second most important issue. An error propagation formalism was developed to address various instrument geometries examined as part of this study. The formalism propagates metrology errors from the gauge readings through to the angle on the sky. An introduction to the formalism is presented.

Citation Download Citation

Richard L. Baron, Mark H. Milman, and Kim M. Aaron "SIM vs. SOS: a space interferometry trade study", Proc. SPIE 3350, Astronomical Interferometry, (24 July 1998); https://doi.org/10.1117/12.317181

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