Metrology source for high-resolution heterodyne interferometer laser gauges

Serge Dubovitsky; David J. Seidel; Duncan Tsuen-Hsi Liu; Roman C. Gutierrez

doi:10.1117/12.317166

24 July 1998 Metrology source for high-resolution heterodyne interferometer laser gauges

Serge Dubovitsky, David J. Seidel, Duncan Tsuen-Hsi Liu, Roman C. Gutierrez

Proceedings Volume 3350, Astronomical Interferometry; (1998) https://doi.org/10.1117/12.317166
Event: Astronomical Telescopes and Instrumentation, 1998, Kona, HI, United States

Abstract

We describe the development, functional performance, and space-qualification status of a Metrology Source suitable for implementation of space-based metrology systems with picometer-level relative displacement measurement and micron-level absolute displacement measurement resolution. The Metrology Source consists of the following components: lasers, frequency stabilization system, frequency shifters, and frequency modulators. All components are interconnected by polarization maintaining fibers to facilitate integration into a lightweight space-qualifiable module.

Citation Download Citation

Serge Dubovitsky, David J. Seidel, Duncan Tsuen-Hsi Liu, and Roman C. Gutierrez "Metrology source for high-resolution heterodyne interferometer laser gauges", Proc. SPIE 3350, Astronomical Interferometry, (24 July 1998); https://doi.org/10.1117/12.317166

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