Deep Space 3 metrology system

Serge Dubovitsky; Roger P. Linfield; Gary H. Blackwood; Peter W. Gorham; Michael Shao; William M. Folkner; Jeffrey W. Yu

doi:10.1117/12.317103

24 July 1998 Deep Space 3 metrology system

Serge Dubovitsky, Roger P. Linfield, Gary H. Blackwood, Peter W. Gorham, Michael Shao, William M. Folkner, Jeffrey W. Yu

Author Affiliations +

Proceedings Volume 3350, Astronomical Interferometry; (1998) https://doi.org/10.1117/12.317103
Event: Astronomical Telescopes and Instrumentation, 1998, Kona, HI, United States

Abstract

A metrology subsystem on board the Deep Space 3, a separated spacecraft interferometer mission, is used to determine stellar fringe delay jitter, delay rate, and initial delay. The subsystem implements two capabilities: linear metrology for optical pathlength determination and angular metrology needed to determine the configuration and orientation of the spacecraft constellation. Frequency modulated metrology concept is used to implement high-precision (5nm) interferometric linear measurements over large target ranges (1km). System is made angle sensitive by using an articulated flat mirror at the target.

Citation Download Citation

Serge Dubovitsky, Roger P. Linfield, Gary H. Blackwood, Peter W. Gorham, Michael Shao, William M. Folkner, and Jeffrey W. Yu "Deep Space 3 metrology system", Proc. SPIE 3350, Astronomical Interferometry, (24 July 1998); https://doi.org/10.1117/12.317103

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