Paper
17 April 1998 Color characterization of an LC projection system using multiple-regression matrix and look-up table with interpolation
Ming-Jiun Liaw, Chun-Yen Chen, Han-Ping D. Shieh
Author Affiliations +
Proceedings Volume 3296, Projection Displays IV; (1998) https://doi.org/10.1117/12.305530
Event: Photonics West '98 Electronic Imaging, 1998, San Jose, CA, United States
Abstract
A forward model of an LC projector is studied to predict its colorimetric attribution. To identify color characteristics of the projector, 729 colors were measured in a dark room. The forward model was built using three methods: (1) a 3 X 11 multiple-polynomial regression matrix, (2) 3D look- up table (LUT) with cubic interpolation, and (3) a 1D LUT with linear interpolation. In addition, 216 colors were also measured to evaluate the prediction accuracy of the forward model. All methods can be used to obtain acceptable predictions of colorimetric attributions on the lC projector. When the 3 X 11 multiple-polynomial regression matrix was used, the average and maximum prediction differences were 2.18 and 6.68 (Delta) Euv respectively. For the 3D LUT method, those values were 3.3 and 16.4 (Delta) Euv, respectively. The results of the 1D LUT are comparable with those of the 3D LUT if the sampling points per channel of these two approaches are the same. If the sampling points per channel are dense enough, for example 16 points per channel, the performance of the 1D LUT is better than that of the 3 X 11 multiple-polynomial regression matrix.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ming-Jiun Liaw, Chun-Yen Chen, and Han-Ping D. Shieh "Color characterization of an LC projection system using multiple-regression matrix and look-up table with interpolation", Proc. SPIE 3296, Projection Displays IV, (17 April 1998); https://doi.org/10.1117/12.305530
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KEYWORDS
Projection systems

RGB color model

3D modeling

Liquid crystals

Electro optical modeling

3D metrology

Instrument modeling

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