Soft x-ray laser-based moire deflectometry of dense plasmas

Franz A. Weber; Troy W. Barbee Jr.; Peter M. Celliers; Luiz Barroca Da Silva; Kazuo A. Tanaka; Ryosuke Kodama; Kenjiro Takahashi

doi:10.1117/12.293377

1 November 1997 Soft x-ray laser-based moire deflectometry of dense plasmas

Franz A. Weber, Troy W. Barbee Jr., Peter M. Celliers, Luiz Barroca Da Silva, Kazuo A. Tanaka, Ryosuke Kodama, Kenjiro Takahashi

Author Affiliations +

Proceedings Volume 3156, Soft X-Ray Lasers and Applications II; (1997) https://doi.org/10.1117/12.293377
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

Soft x-ray laser based Moire deflectometry has been shown to be a viable and useful diagnostic for probing dense plasmas relevant to inertial confinement fusion (ICF). Collisionally pumped soft x-ray lasers are thereby used as reliable radiation sources which provide unique intensity and coherence characteristics in the soft x-ray region in order to overcome the adverse effects of absorption and refraction of the probe beam in the plasma. We present results obtained from Moire deflectometry experiments carried out at the ILE Gekko XII laser facility where the neon-like germanium x-ray laser with line emission at 196 angstrom has been used to probe laser produced plasmas created from 100 micrometer thick CH targets. Besides a high brightness the x-ray laser exhibits small beam divergence (less than 4 mrad) and short pulse duration of about 80 ps. The results show that peak electron densities of 3 X 10²¹ cm^-3 at the initial target surface can be probed with this diagnostic technique, however, no convincing evidence was found for channel formation in the plasma caused by a 1 (omega) (1.053 micrometer) drill beam.

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Franz A. Weber, Troy W. Barbee Jr., Peter M. Celliers, Luiz Barroca Da Silva, Kazuo A. Tanaka, Ryosuke Kodama, and Kenjiro Takahashi "Soft x-ray laser-based moire deflectometry of dense plasmas", Proc. SPIE 3156, Soft X-Ray Lasers and Applications II, (1 November 1997); https://doi.org/10.1117/12.293377

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KEYWORDS

Plasmas

X-ray lasers

Laser beam diagnostics

Moire patterns

X-rays

Deflectometry

Picosecond phenomena

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