Mueller matrix imaging of GaAs/AlGaAs self-imaging beamsplitting waveguides

Matthew H. Smith; Elizabeth A. Sornsin; Tristan Jorge Tayag; Russell A. Chipman

doi:10.1117/12.278982

3 October 1997 Mueller matrix imaging of GaAs/AlGaAs self-imaging beamsplitting waveguides

Matthew H. Smith, Elizabeth A. Sornsin, Tristan Jorge Tayag, Russell A. Chipman

Proceedings Volume 3121, Polarization: Measurement, Analysis, and Remote Sensing; (1997) https://doi.org/10.1117/12.278982
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

Imaging polarimetry is a novel method of characterizing the polarization effects of optoelectronic devices. From the Mueller matrix image, any polarization property of a device can be determined. High resolution polarization images of the outcoupling faces of several self-imaging GaAs/AlGaAs waveguide beamsplitters were made in the Mueller matrix imaging polarimeter at the University of Alabama in Huntsville. Interesting polarization states of the device modes (TE and TM), the magnitude of linear retardance varied significantly across a device. Polarization losses were also observed to vary across the faces of the devices. These effects could not have been observed by simply measuring the crosstalk between the TE and TM modes. The results of this study could lead to the detection of defect mechanisms in optoelectronic devices through Mueller matrix measurements.

Citation Download Citation

Matthew H. Smith, Elizabeth A. Sornsin, Tristan Jorge Tayag, and Russell A. Chipman "Mueller matrix imaging of GaAs/AlGaAs self-imaging beamsplitting waveguides", Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); https://doi.org/10.1117/12.278982

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