Evaluation of Russian-grown Cd0.8Zn0.2Te

Michael M. Schieber; Haim Hermon; Ralph B. James; James C. Lund; Arlyn J. Antolak; Daniel H. Morse; Nikolai N. Kolesnikov; Y. N. Ivanov; Mark S. Goorsky; H. Yoon; James E. Toney; Tuviah E. Schlesinger

doi:10.1117/12.277699

7 July 1997 Evaluation of Russian-grown Cd_0.8Zn_0.2Te

Michael M. Schieber, Haim Hermon, Ralph B. James, James C. Lund, Arlyn J. Antolak, Daniel H. Morse, Nikolai N. Kolesnikov, Y. N. Ivanov, Mark S. Goorsky, H. Yoon, James E. Toney, Tuviah E. Schlesinger

Author Affiliations +

Proceedings Volume 3115, Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications; (1997) https://doi.org/10.1117/12.277699
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

More recent Russian grown single crystals of Cd_0.8Zn_0.2Te (CZT) were evaluated using proton induced x ray emission (PIXE), x ray diffraction (XRD), photoluminescence (PL), infra red (IR) transmission microscopy, leakage current measurements and response to nuclear radiation. Whereas in the past the Russian grown samples were not acceptable for gamma ray detectors application, the present samples had a somewhat better crystallinity and a higher resistivity, and did even show distinct photopeaks for an ²⁴¹Am spectrum. Differences in the material properties between various Russian (n- and p-type) and U.S. (n-type) CZT are described.

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Michael M. Schieber, Haim Hermon, Ralph B. James, James C. Lund, Arlyn J. Antolak, Daniel H. Morse, Nikolai N. Kolesnikov, Y. N. Ivanov, Mark S. Goorsky, H. Yoon, James E. Toney, and Tuviah E. Schlesinger "Evaluation of Russian-grown Cd_0.8Zn_0.2Te", Proc. SPIE 3115, Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications, (7 July 1997); https://doi.org/10.1117/12.277699

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