Paper
27 March 1997 Target recognition under projective transformation
Wei An, Zhongkang Sun, Hui Xu, Hong Li, Xiong Hui
Author Affiliations +
Abstract
Projective transformation (PT) is the most general transformation in nature. However, as it is nonlinear, people haven't made great progress in the research of projective invariant. On the other hand, many researchers are confused with PT and affine transformation (AT), they used projective deformed patterns testify affine invariants without any additional explanation. This paper has thoroughly studied PT and AT. When the fixed point or fixed axis of PT is on some special positions, PT degenerates into linear form - AT. In other cases, PT can be approximated as AT under certain condition. In this paper we derived a formula of relation between them and analyzed the errors arising from this approximation. It leads a new way to recognize projective deformed patterns. Three new independent affine moment invariants composed of second- or third-order central moments are adopted for 2D and 3D target recognition. The simulation experiment reached a satisfying result.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei An, Zhongkang Sun, Hui Xu, Hong Li, and Xiong Hui "Target recognition under projective transformation", Proc. SPIE 3073, Optical Pattern Recognition VIII, (27 March 1997); https://doi.org/10.1117/12.270354
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Cited by 1 scholarly publication.
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KEYWORDS
Target recognition

Image processing

3D acquisition

Pattern recognition

Lead

Error analysis

Defense technologies

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