Paper
27 March 1997 Phase-only projection-slice filters for invariant optical pattern recognition
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Abstract
The projection-slice theorem, often used in tomographic applications for medical imaging, is utilized in conjunction with the SDF concept to implement a distortion-invariant filter. The marriage of these two well-known fields results in an effective tool for invariant pattern recognition. 1D filtering and phase-only techniques are used to implement the projection-slice synthetic discriminant function filter, which is then compared with bench-mark filters, such as the SDF filter and the matched filter in both complex and phase- only forms for a particular set of images.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vahid R. Riasati, Mustafa A. G. Abushagur, and Don A. Gregory "Phase-only projection-slice filters for invariant optical pattern recognition", Proc. SPIE 3073, Optical Pattern Recognition VIII, (27 March 1997); https://doi.org/10.1117/12.270404
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Image filtering

Phase only filters

Optical filters

Fourier transforms

Distortion

Fused deposition modeling

Optical pattern recognition

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