Real-time holographic nondestructive inspection system with automatic defect classification

Helen H. Chen; Tin M. Aye; Dai Hyun Kim; Jack A. Latchinian; Vernon A. Brown; Andrew A. Kostrzewski; Gajendra D. Savant; Tomasz P. Jannson; Charles G. Pergantis

doi:10.1117/12.271244

15 April 1997 Real-time holographic nondestructive inspection system with automatic defect classification

Helen H. Chen, Tin M. Aye, Dai Hyun Kim, Jack A. Latchinian, Vernon A. Brown, Andrew A. Kostrzewski, Gajendra D. Savant, Tomasz P. Jannson, Charles G. Pergantis

Author Affiliations +

Proceedings Volume 3029, Machine Vision Applications in Industrial Inspection V; (1997) https://doi.org/10.1117/12.271244
Event: Electronic Imaging '97, 1997, San Jose, CA, United States

Abstract

We describe here a holographic non-destructive inspection (NDI) technology developed by Physical Optics Corporation. It is based on real-time holographic dye polymer materials and a shearographic camera, with neural network defect classification software. Holograms can be recorded in or erased from the new dye polymer material in a millisecond without wet processing, making real-time holographic NDI feasible. The shearographic NDI system, based on laser speckle interferometry, compensates for low-light conditions. Both holographic and shearographic fringes are input to the neural network system to perform automatic defect type classification.

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Helen H. Chen, Tin M. Aye, Dai Hyun Kim, Jack A. Latchinian, Vernon A. Brown, Andrew A. Kostrzewski, Gajendra D. Savant, Tomasz P. Jannson, and Charles G. Pergantis "Real-time holographic nondestructive inspection system with automatic defect classification", Proc. SPIE 3029, Machine Vision Applications in Industrial Inspection V, (15 April 1997); https://doi.org/10.1117/12.271244

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