Paper
10 April 1997 IDT-SEM observation of fringe pattern in volume hologram and its application to multicolor recorded HOEs
Motoshi Ono, Misato Uchida, Akio Masui, Norihito Nakazawa, Hiromi Sakurai, Masahiro Hirano
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Abstract
Photopolymer films developed by DuPont have excellent features as volume hologram recording material including high resolution, high diffraction efficiency, full color recording capability and fabrication with all dry processing. We have prepared several types of HOEs by using the films to implement designed function such as high power, multi-color recording and controlling of the diffraction bandwidth. To accomplish them, direct and precise knowledge of the fringe pattern such as slant angle and fringe space was strongly required. We have developed a new technique for the observation of the fringe pattern by scanning electron microscope (SEM) with an aid of Iodine dying pre-treatment (IDT-SEM). It is thought that Iodine is preferentially adsorbed at double bondings in unpolymerized monomers, which leads to a presumption that Iodine distribution detected by SEM accurately reproduce the refractive index modulation in volume hologram. This has been confirmed experimentally by the observation that fast Fourier transform analyses of SEM images for single, two and three color recorded HOEs are good agreement with optical spectra of the HOEs. The SEM image provides us the spatial information of both fringe space and slant angle with good resolution. This technique has been further applicable to other type of HOEs.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Motoshi Ono, Misato Uchida, Akio Masui, Norihito Nakazawa, Hiromi Sakurai, and Masahiro Hirano "IDT-SEM observation of fringe pattern in volume hologram and its application to multicolor recorded HOEs", Proc. SPIE 3011, Practical Holography XI and Holographic Materials III, (10 April 1997); https://doi.org/10.1117/12.271353
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KEYWORDS
Holograms

Scanning electron microscopy

Fringe analysis

Holographic optical elements

Iodine

Volume holography

Refractive index

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