Paper
18 December 1996 Generation of picosecond far-infrared pulses using laser-activated semiconductor reflection switches
Frank A. Hegmann, Mark S. Sherwin
Author Affiliations +
Abstract
A source of high-intensity, picosecond-to-nanosecond far-IR pulses has been developed at the UCSB Center for Free- Electron Laser Studies. The microsecond-long, far-IR output of the UCSB free-electron laser is sliced into shorter pulses using laser-activated semiconductor reflection switches. We have observed pulse durations as short as 20 ps at 22 cm-1. An overview of the design and performance of the pulse-slicer system is given.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Frank A. Hegmann and Mark S. Sherwin "Generation of picosecond far-infrared pulses using laser-activated semiconductor reflection switches", Proc. SPIE 2842, Millimeter and Submillimeter Waves and Applications III, (18 December 1996); https://doi.org/10.1117/12.262736
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Cited by 15 scholarly publications.
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KEYWORDS
Switches

Switching

Silicon

Reflection

Free electron lasers

Picosecond phenomena

Semiconducting wafers

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