Simple model for CCD yield

Arkadi N. Markov

doi:10.1117/12.238206

8 April 1996 Simple model for CCD yield

Arkadi N. Markov

Proceedings Volume 2790, Fifth Conference on Charge-Coupled Devices and CCD Systems; (1996) https://doi.org/10.1117/12.238206
Event: Fifth Conference on Charge-Coupled Devices and CCD Systems, 1995, Krym, Russian Federation

Abstract

A simple equation for CCD yield depending on the technological environment condition is derived. An approach demonstrated can be generalized to analyze the yield relating problems for many kinds of ICs.

Citation Download Citation

Arkadi N. Markov "Simple model for CCD yield", Proc. SPIE 2790, Fifth Conference on Charge-Coupled Devices and CCD Systems, (8 April 1996); https://doi.org/10.1117/12.238206

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