Determination of the penetration depth in YBa2Cu3O7 thin films from far-infrared transmission

Nicole Bontemps; Louis-Anne de Vaulchier

doi:10.1117/12.241746

10 June 1996 Determination of the penetration depth in YBa₂Cu₃O₇ thin films from far-infrared transmission

Nicole Bontemps, Louis-Anne de Vaulchier

Proceedings Volume 2696, Spectroscopic Studies of Superconductors; (1996) https://doi.org/10.1117/12.241746
Event: Photonics West '96, 1996, San Jose, CA, United States

Abstract

Transmission measurements in the range 130 GHz - 500 GHz on YBa₂Cu₃O_{7- (delta} ) epitaxial thin films are reported and discussed. We deduce the absolute value of the electromagnetic penetration depth (lambda) (T) from the frequency variation of the transmission. We concentrate on our highest quality film, which yields (lambda) (OK) equals (1570 plus or minus 200 angstrom), associated with a linear temperature dependence of (lambda) (T) which maps at low temperature (T less than 20 K) the data on high quality single crystals. We derive the real part of the conductivity from the small difference between the film and the single crystal data.

Citation Download Citation

Nicole Bontemps and Louis-Anne de Vaulchier "Determination of the penetration depth in YBa₂Cu₃O₇ thin films from far-infrared transmission", Proc. SPIE 2696, Spectroscopic Studies of Superconductors, (10 June 1996); https://doi.org/10.1117/12.241746

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