Paper
19 November 1980 Design For An Automated Recognition System For Multilayer Circuit Board Testing
Charles C.K Cheng
Author Affiliations +
Proceedings Volume 0255, Practical Electro-Optical Instruments and Techniques; (1980) https://doi.org/10.1117/12.959560
Event: 1980 Huntsville Technical Symposium, 1980, Huntsville, United States
Abstract
An automated recognition system which utilizes a precision optical front-end, an electronic error-recog-nition system, an x-y table-positioning assembly and a printer was proposed, and a prototype model was constructed to prove its feasibility. The described system is capable of detecting line flaws and errors in conductor registration and in network characteristic impedance. The line-width information detected can be used both for impedance measurement and for detecting line flaws due to overwidth and underwidth conductors. Based upon performance, results show that the recognition system has good errordetecting resolution for all serious defects. It also provides a fast, reliable, practical method for measuring and testing printed wire width, thus solving a serious problem in manufacturing circuit boards for computer use.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Charles C.K Cheng "Design For An Automated Recognition System For Multilayer Circuit Board Testing", Proc. SPIE 0255, Practical Electro-Optical Instruments and Techniques, (19 November 1980); https://doi.org/10.1117/12.959560
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KEYWORDS
Copper

Inspection

Prototyping

Oscilloscopes

Printing

Mirrors

Pulsed laser operation

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