Resolution and degrees of freedom in near-field scanning microscopy

Guiying Wang; Zhihua Ding; Zhifeng Fan; ZhiJiang Wang

doi:10.1117/12.218684

6 September 1995 Resolution and degrees of freedom in near-field scanning microscopy

Guiying Wang, Zhihua Ding, Zhifeng Fan, ZhiJiang Wang

Proceedings Volume 2535, Near-Field Optics; (1995) https://doi.org/10.1117/12.218684
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

An expression of evanescent field of the scanning near-field optical microscope (SNOM) and a few effects on the resolving power are given. The concept about degrees of freedom of light information transmitted and resolution of SNOM are reviewed.

Citation Download Citation

Guiying Wang, Zhihua Ding, Zhifeng Fan, and ZhiJiang Wang "Resolution and degrees of freedom in near-field scanning microscopy", Proc. SPIE 2535, Near-Field Optics, (6 September 1995); https://doi.org/10.1117/12.218684

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