Imaging artifacts of dielectric specimens in transmission mode near-field scanning optical microscopy

Gary A. Valaskovic; Mark A. Holton; George H. Morrison

doi:10.1117/12.218695

6 September 1995 Imaging artifacts of dielectric specimens in transmission mode near-field scanning optical microscopy

Gary A. Valaskovic, Mark A. Holton, George H. Morrison

Proceedings Volume 2535, Near-Field Optics; (1995) https://doi.org/10.1117/12.218695
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

Uncertainty in tip morphology of aluminum coated, fiber-optic near-field probes, and the large difference between the physical probe diameter and (smaller) optical diameter, lead to serious imaging artifacts in transmission mode near-field microscopy. Various dielectric materials of different topographies have been studied to develop an understanding of normal and anomalous contrast modes mainly characterized by topographically induced contrast.

Citation Download Citation

Gary A. Valaskovic, Mark A. Holton, and George H. Morrison "Imaging artifacts of dielectric specimens in transmission mode near-field scanning optical microscopy", Proc. SPIE 2535, Near-Field Optics, (6 September 1995); https://doi.org/10.1117/12.218695

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