Paper
6 September 1995 Dependence of contrast on probe/sample spacing with the magneto-optic Kerr effect scanning near-field magneto-optic microscope (MOKE-SNOM)
Thomas J. Silva, A. B. Kos
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Abstract
A magneto-optic Kerr effect scanning near-field optical microscope is used to image a stripe domain wall in a Co/Pt multilayer sample. The microscope is an improved version of a type previously reported, which uses light scattering from surface plasmons in 20 - 40 nm Ag particles as a near-field probe. Data is presented for both the probe intensity and polarization contrast as a function of probe/sample spacing. Oscillatory behavior in both sets of data is reasonably explained with a simplified model of optical interference.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Thomas J. Silva and A. B. Kos "Dependence of contrast on probe/sample spacing with the magneto-optic Kerr effect scanning near-field magneto-optic microscope (MOKE-SNOM)", Proc. SPIE 2535, Near-Field Optics, (6 September 1995); https://doi.org/10.1117/12.218702
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Cited by 4 scholarly publications.
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KEYWORDS
Particles

Near field scanning optical microscopy

Polarization

Light scattering

Silver

Magneto-optics

Microscopes

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