Numerical simulation of electron-impact x-ray sources

Martin E. Sulkanen; Jeffery J. Kolodziejczak; George Chartas

doi:10.1117/12.212605

20 June 1995 Numerical simulation of electron-impact x-ray sources

Martin E. Sulkanen, Jeffery J. Kolodziejczak, George Chartas

Proceedings Volume 2515, X-Ray and Extreme Ultraviolet Optics; (1995) https://doi.org/10.1117/12.212605
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

Electron-impact x-ray sources will be used to calibrate the Advanced X-Ray Astrophysics Facility (AXAF), and models of the source x-ray spectra are necessary in forecasting the calibration performance. We simulate the spectra of x-ray lines and continuum (0.1 - 13 keV) arising from electron impact on solid targets. We use simple models for electron transport, line and continuum emissivities, and radiative transport through the target. The electrons are attenuated in energy in the target but are unscattered in direction. The continuum x-ray emission is modeled as bremsstrahlung, and the characteristic x-ray line emission is modeled by electron collisional ionization followed by radiative decay to form the lines. X-ray attenuation is also included in the radiative transfer through the target. Multilayer or compound targets can be easily treated. We compare the spectra produced by this model to the model of Pella et al. and data from metal targets.

Citation Download Citation

Martin E. Sulkanen, Jeffery J. Kolodziejczak, and George Chartas "Numerical simulation of electron-impact x-ray sources", Proc. SPIE 2515, X-Ray and Extreme Ultraviolet Optics, (20 June 1995); https://doi.org/10.1117/12.212605

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