Reliability of lithium niobate Annealed Proton Exchanged integrated optical circuits

Karl M. Kissa; Hogan Eng; David K. Lewis; Vincent D. Rodino; Paul G. Suchoski Jr.; Nancy A. Koziarz

doi:10.1117/12.212700

30 June 1995 Reliability of lithium niobate Annealed Proton Exchanged integrated optical circuits

Karl M. Kissa, Hogan Eng, David K. Lewis, Vincent D. Rodino, Paul G. Suchoski Jr., Nancy A. Koziarz

Proceedings Volume 2481, Photonic Device Engineering for Dual-Use Applications; (1995) https://doi.org/10.1117/12.212700
Event: SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics, 1995, Orlando, FL, United States

Abstract

Several studies have been performed recently that demonstrate the reliability of lithium niobate Annealed Proton Exchanged (APE) Integrated Optical Circuits (IOCs). Studies have been performed on APE IOC die as well as pigtailed and packaged devices. The tests indicate that the reliability of APE IOCs meet or surpass the needs of most military and commercial applications.

Citation Download Citation

Karl M. Kissa, Hogan Eng, David K. Lewis, Vincent D. Rodino, Paul G. Suchoski Jr., and Nancy A. Koziarz "Reliability of lithium niobate Annealed Proton Exchanged integrated optical circuits", Proc. SPIE 2481, Photonic Device Engineering for Dual-Use Applications, (30 June 1995); https://doi.org/10.1117/12.212700

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