Direct-write scene generation test facility system noise study

D. Michael Tripp; Heard S. Lowry III; Parker David Elrod

doi:10.1117/12.210548

30 May 1995 Direct-write scene generation test facility system noise study

D. Michael Tripp, Heard S. Lowry III, Parker David Elrod

Proceedings Volume 2474, Smart Focal Plane Arrays and Focal Plane Array Testing; (1995) https://doi.org/10.1117/12.210548
Event: SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics, 1995, Orlando, FL, United States

Abstract

The Scene Generation Test Capability (SGTC) program at AEDC has completed development of the Direct Write Scene Generation (DWSG) test facilities which provide a dynamic mission simulation capability for Focal Plane Arrays (FPAs) and their associated signal processing electronics. The first phase of the program was completed in September 1991 and supplied a near-term test capability (designated for Transportable Direct Write Scene Generator, or TDWSG) to meet the test requirements of future early warning sensor systems. Over the last two years the TDWSG has been involved in test activities to validate the DWSG technique for meeting system mission simulation requirements. The DWSG approach is based on the ability to accurately control the position and amplitude of multiple laser beams through the application of radio frequencies to a set of acousto-optic deflectors. One of the primary concerns related to using the TDWSG for mission simulation is the system noise associated with the test facility. A system noise study was conducted using a low noise LWIR Si:As FPA and an optical power meter. Radiometric signal and noise measurements were acquired and used as a baseline for comparison with the TDWSG data to quantify the noise contributions of individual TDWSG subsystems. This paper presents an overview of the DWSG concept, results of the system noise study, and results of system precision measurements.

Citation Download Citation

D. Michael Tripp, Heard S. Lowry III, and Parker David Elrod "Direct-write scene generation test facility system noise study", Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); https://doi.org/10.1117/12.210548

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KEYWORDS

Sensors

Staring arrays

Intermodulation

Semiconductor lasers

Laser stabilization

Optical amplifiers

Acousto-optics

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