Pupil functions for aberration correction in 3D microscopy

Christian K. Sieracki; Eric W. Hansen

doi:10.1117/12.205327

23 March 1995 Pupil functions for aberration correction in 3D microscopy

Christian K. Sieracki, Eric W. Hansen

Proceedings Volume 2412, Three-Dimensional Microscopy: Image Acquisition and Processing II; (1995) https://doi.org/10.1117/12.205327
Event: IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology, 1995, San Jose, CA, United States

Abstract

When a confocal fluorescence microscope with a high numerical aperture oil immersion objective is focused deep into an aqueous medium, aberrations result which weaken and blur the observed image. We have designed, fabricated and tested a two-level binary phase mask which partially corrects these aberrations, improving image brightness and resolution. A four- level mask was also designed, fabricated and tested with further brightness and resolution improvement. The mask designs and simulated and measured results are presented in this paper.

Citation Download Citation

Christian K. Sieracki and Eric W. Hansen "Pupil functions for aberration correction in 3D microscopy", Proc. SPIE 2412, Three-Dimensional Microscopy: Image Acquisition and Processing II, (23 March 1995); https://doi.org/10.1117/12.205327

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