Scattering of IR and visible radiation from hollow waveguides

Reuben Dahan; Jacob Dror; Alexandra Inberg; Nathan I. Croitoru

doi:10.1117/12.208424

1 May 1995 Scattering of IR and visible radiation from hollow waveguides

Reuben Dahan, Jacob Dror, Alexandra Inberg, Nathan I. Croitoru

Proceedings Volume 2396, Biomedical Optoelectronic Instrumentation; (1995) https://doi.org/10.1117/12.208424
Event: Photonics West '95, 1995, San Jose, CA, United States

Abstract

The scattering phenomenon of infrared and visible radiation from hollow waveguides, made of teflon or fused silica, having Ag and AgI guiding layers, was measured by two methods; Total Integrated Scattered and Backscattering. The root means square roughness was evaluated by both methods. It was found that the roughness of the silver layer is influenced by the substrate. The AgI is the main contributor to roughness and this is a function of its preparation method.

Citation Download Citation

Reuben Dahan, Jacob Dror, Alexandra Inberg, and Nathan I. Croitoru "Scattering of IR and visible radiation from hollow waveguides", Proc. SPIE 2396, Biomedical Optoelectronic Instrumentation, (1 May 1995); https://doi.org/10.1117/12.208424

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