Paper
3 October 1994 Development of a high-speed single inline memory module (SIMM) connector inspection system
James Mahon, Sean O'Neill
Author Affiliations +
Proceedings Volume 2347, Machine Vision Applications, Architectures, and Systems Integration III; (1994) https://doi.org/10.1117/12.188743
Event: Photonics for Industrial Applications, 1994, Boston, MA, United States
Abstract
This paper describes a SIMM (Single Inline Memory Module) inspection system called SIMMI. The system inspects the front 'C-Gap' of the SIMMS and the back 'True Position' of the solder tails at 1.07 seconds/connector using 3 synchronized shuttered cameras with Telecentric Optics. This system is a very high speed (75 frames/second) inspection system designed from off-the-shelf hardware for inspecting SIMMs to a high degree of accuracy (< 4 micron repeatability). The system used standard linear and area techniques to process 700 measurements/second on an EISA based framestore hosted in 486 based PC. The paper will describe the system, and the techniques which were used to test and debug the system, which is not a trivial problem when the system is processing 75 frames/second. In particular, the paper will describe the techniques used to synchronize the camera and SIMM driver mechanics and the evolution of the lighting techniques.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James Mahon and Sean O'Neill "Development of a high-speed single inline memory module (SIMM) connector inspection system", Proc. SPIE 2347, Machine Vision Applications, Architectures, and Systems Integration III, (3 October 1994); https://doi.org/10.1117/12.188743
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KEYWORDS
Inspection

Cameras

Connectors

Computing systems

Imaging systems

Light sources and illumination

Image storage

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