Paper
12 December 1994 Laser diode wavefronts and waveguide parameters: interferometric measurements
Author Affiliations +
Abstract
Interferometric measurements of wavefront phase distributions for laser diodes applied in optical disk memory units were carried out. The influence of laser diode wavefront astigmatism on the focused light spot dimensions was investigated.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ludmila E. Batay, Andrei N. Kuzmin, Gennadii I. Ryabtsev, Sergei V. Voitikov, and Alexandr Smal "Laser diode wavefronts and waveguide parameters: interferometric measurements", Proc. SPIE 2340, Interferometry '94: New Techniques and Analysis in Optical Measurements, (12 December 1994); https://doi.org/10.1117/12.195935
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Semiconductor lasers

Wavefronts

Interferometry

Optical discs

Interferometers

Phase measurement

Diffraction

RELATED CONTENT

Optical Systems For Optical Disk Technology
Proceedings of SPIE (May 27 1982)
Aerial image based lens metrology for wafer steppers
Proceedings of SPIE (March 15 2006)
Micro-optics metrology using advanced interferometry
Proceedings of SPIE (June 13 2005)
Video Disk Optics
Proceedings of SPIE (May 27 1982)

Back to Top