Paper
6 October 1994 Pulsed photon interrogation with neutron-induced gamma-ray spectrometry for cargo inspections
James L. Jones, Yale D. Harker, Woo Y. Yoon, L. O. Johnson, R. S. Lawrence
Author Affiliations +
Abstract
An accelerator-based, active, pulsed, interrogation system capable of non-destructive, elemental analysis from secondary gamma-ray emissions is being developed for various inspection applications. The system consists of a very narrow pulsed, electron accelerator (> 8 MeV) for photoneutron production and a multiple channel, gamma-ray detection system capable of ultra-fast detection. This system has applicability to cargo container inspections. Advantages of the system include use of highly penetrative, energetic, interrogating X-rays, compatibility with existing X-ray inspection systems, capability of large neutron production yield from the pulsed accelerator, ability to induce a volumetric, tailored neutron source spectrum within or very near the containers, and most importantly, the spectrometry capability of a ultra-fast, gamma-ray detection system. The portable detection system is described which has been designed to acquire multiple, single gamma-ray events (up to 40 MHz between each accelerator pulse) from neutron inelastic scattering (starting from within 100 ns after an accelerator pulse) and neutron capture interactions. The system and its overall operational requirements are described. Experimental results, using a 50 ps electron accelerator pulse and selected inspected objects, are presented along with numerical predictions and system characterizations.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James L. Jones, Yale D. Harker, Woo Y. Yoon, L. O. Johnson, and R. S. Lawrence "Pulsed photon interrogation with neutron-induced gamma-ray spectrometry for cargo inspections", Proc. SPIE 2276, Cargo Inspection Technologies, (6 October 1994); https://doi.org/10.1117/12.189181
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CITATIONS
Cited by 5 scholarly publications and 2 patents.
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KEYWORDS
X-rays

Gamma radiation

Sensors

Inspection

Electron beams

Scintillators

Nondestructive evaluation

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