Express method for optical strength diagnostics in transparent dielectrics and semiconductors

Nadezhda E. Korsunskaya; Nicolai R. Kulish; Grigory S. Pekar; Aleksandr F. Singaevsky

doi:10.1117/12.191984

31 October 1994 Express method for optical strength diagnostics in transparent dielectrics and semiconductors

Nadezhda E. Korsunskaya, Nicolai R. Kulish, Grigory S. Pekar, Aleksandr F. Singaevsky

Proceedings Volume 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1994) https://doi.org/10.1117/12.191984
Event: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics: International Workshop, 1993, Kiev, Ukraine

Abstract

The monopulse method for rapidly determining the threshold energy E_th and threshold power density J_th of optical destruction in optically transparent dielectrics and semiconductors is developed. This method of diagnostics is based on measuring the optical transmission and electrical conductivity of the specimen under irradiation by laser pulses. The advantages of such diagnostics over the previously developed multi-pulsed methods are analyzed. As an example, the use of the method proposed for CdS single crystals, among them the crystals with uniquely high optical strength (J_th equals 600 - 800 MW/cm²), is described.

Citation Download Citation

Nadezhda E. Korsunskaya, Nicolai R. Kulish, Grigory S. Pekar, and Aleksandr F. Singaevsky "Express method for optical strength diagnostics in transparent dielectrics and semiconductors", Proc. SPIE 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (31 October 1994); https://doi.org/10.1117/12.191984

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