Research on a new measuring and analyzing system for curved surface topography

Xiangqian Jiang; Ting-Xi Gu; Zhu Li

doi:10.1117/12.156374

22 September 1993 Research on a new measuring and analyzing system for curved surface topography

Xiangqian Jiang, Ting-Xi Gu, Zhu Li

Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156374
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China

Abstract

In this paper, a new measuring and analysing system for curved surfaces topography is described. The system working principle is discussed. The photoelectric signal processing,hardware and software designing and the model of data processing about curved surfaces are also investigated.Finally, experimental results are given.

Citation Download Citation

Xiangqian Jiang, Ting-Xi Gu, and Zhu Li "Research on a new measuring and analyzing system for curved surface topography", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); https://doi.org/10.1117/12.156374

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available