Infrared external reflection spectra of Langmuir-Blodgett film on silica substrate

Koichi Nishikida

doi:10.1117/12.166751

31 January 1994 Infrared external reflection spectra of Langmuir-Blodgett film on silica substrate

Koichi Nishikida

Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166751
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada

Abstract

Infrared reflection spectra of bilayer, Langmuir-Blodgett (L-B) films on the glass substrate were measured. Although a reflection spectrum of the substrate is the major feature of the bilayer spectrum, weak spectral features of the L-B film are overlapping. The phase and intensity of each infrared band varies by incident angle and polarization of the infrared radiation. Spectral simulations were carried out to explain the effect of incident angle and polarization on phase and intensity.

Citation Download Citation

Koichi Nishikida "Infrared external reflection spectra of Langmuir-Blodgett film on silica substrate", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); https://doi.org/10.1117/12.166751

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