Paper
31 January 1994 Dynamic infrared spectroscopy with a fast scan FTIR spectrometer
A. J. Turner, Robert A. Hoult
Author Affiliations +
Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166792
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada
Abstract
A normal fast scanning FTIR spectrometer can be used to obtain dynamic IR spectra by using a technique where information on the sample strain is saved along with each interferogram reading. Software is then used to find correlations between the interferogram data and sample strain and hence extract the time dependent components in the data.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. J. Turner and Robert A. Hoult "Dynamic infrared spectroscopy with a fast scan FTIR spectrometer", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); https://doi.org/10.1117/12.166792
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Cited by 3 scholarly publications.
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KEYWORDS
Infrared spectroscopy

Spectroscopy

FT-IR spectroscopy

Modulation

Statistical analysis

Data acquisition

Dichroic materials

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