Electro-optic characterization of polymeric materials for integrated optics

Emil Aust; Wolfgang Knoll; Werner Hickel; Harald Knobloch; Horst Orendi

doi:10.1117/12.165263

16 December 1993 Electro-optic characterization of polymeric materials for integrated optics

Emil Aust, Wolfgang Knoll, Werner Hickel, Harald Knobloch, Horst Orendi

Proceedings Volume 2025, Nonlinear Optical Properties of Organic Materials VI; (1993) https://doi.org/10.1117/12.165263
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

This contribution deals with the application of some recently developed evanescent wave- optical techniques for the characterization of polymeric thin films as basic structures for integrated optics. Surface plasmon- and guided optical wave-spectroscopies and -microscopies are used to determine the linear and nonlinear optical properties of (chi) ⁽²)-active thin films prepared either by spin-casting from solution or by the Langmuir-Blodgett-Kuhn technique.

Citation Download Citation

Emil Aust, Wolfgang Knoll, Werner Hickel, Harald Knobloch, and Horst Orendi "Electro-optic characterization of polymeric materials for integrated optics", Proc. SPIE 2025, Nonlinear Optical Properties of Organic Materials VI, (16 December 1993); https://doi.org/10.1117/12.165263

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available