Mueller matrix measurements of several optical components

John C. Stover; Marvin L. Bernt; Tod F. Schiff; Brett D. Swimley

doi:10.1117/12.162655

1 December 1993 Mueller matrix measurements of several optical components

John C. Stover, Marvin L. Bernt, Tod F. Schiff, Brett D. Swimley

Proceedings Volume 1995, Optical Scattering: Applications, Measurement, and Theory II; (1993) https://doi.org/10.1117/12.162655
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

The Stokes/Mueller approach provides complete characterization of sample induced polarization changes to both specular and scattered light that is reflected or transmitted from optical components. Ellipsometry is a subset of this more complete approach to polarization analysis. In this paper, Mueller matrices of several samples are found and compared to the matrix of ideal elements. Samples include optical mirrors that scatter both topographically and non-topographically, waveplates, and optical windows.

Citation Download Citation

John C. Stover, Marvin L. Bernt, Tod F. Schiff, and Brett D. Swimley "Mueller matrix measurements of several optical components", Proc. SPIE 1995, Optical Scattering: Applications, Measurement, and Theory II, (1 December 1993); https://doi.org/10.1117/12.162655

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