Phase retardance and optical extinction symmetry measurements for some birefringent materials

Michael A. Bukshtab; Gregory J. Mizell

doi:10.1117/12.167959

1 February 1994 Phase retardance and optical extinction symmetry measurements for some birefringent materials

Michael A. Bukshtab, Gregory J. Mizell

Proceedings Volume 1994, Advanced Optical Manufacturing and Testing IV; (1994) https://doi.org/10.1117/12.167959
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

Results of highly sensitive phase retardance and optical extinction symmetry measurements using a precision ellipsometry apparatus are described. Quartz wave plate retardance measurement accuracy was enhanced through the use of three laser wavelengths at 1064, 632.8, and 532 nm. Optical extinction symmetry phenomena in crystal quartz, KNbO₃, Nd:YVO₄ and TiO₂ was also investigated in order to correlate variations in retardance measurements to crystal quality and orientation accuracy.

Citation Download Citation

Michael A. Bukshtab and Gregory J. Mizell "Phase retardance and optical extinction symmetry measurements for some birefringent materials", Proc. SPIE 1994, Advanced Optical Manufacturing and Testing IV, (1 February 1994); https://doi.org/10.1117/12.167959

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