Study of Fourier descriptors statistical features

Ahmed M. Darwish; Emad-Eldin H. Mohamed

doi:10.1117/12.164861

17 December 1993 Study of Fourier descriptors statistical features

Ahmed M. Darwish, Emad-Eldin H. Mohamed

Proceedings Volume 1989, Computer Vision for Industry; (1993) https://doi.org/10.1117/12.164861
Event: Electronic Imaging Device Engineering, 1993, Munich, Germany

Abstract

In this paper we present a new approach to reduce the computations involved in recognition applications. Fourier descriptors are treated as a occurrence of a complex random variable. Statistical function measures are then used to characterize the behavior of the complex variable. A study of pattern regeneration based on these statistical features was carried out. Some of these statistical measures were found to comprehend most of the object global features. Thus, they could be used for classification and recognition purposes.

Citation Download Citation

Ahmed M. Darwish and Emad-Eldin H. Mohamed "Study of Fourier descriptors statistical features", Proc. SPIE 1989, Computer Vision for Industry, (17 December 1993); https://doi.org/10.1117/12.164861

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