Effect of probe scattering on near field optical imaging of small phase objects: microwave measurements and numerical simulation

Michael Totzeck

doi:10.1117/12.2308504

26 July 1993 Effect of probe scattering on near field optical imaging of small phase objects: microwave measurements and numerical simulation

Michael Totzeck

Author Affiliations +

Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 19832D (1993) https://doi.org/10.1117/12.2308504
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary

Abstract

Measurements for investigation of collection and reflection mode scanning near field optical microscopy (SNOM) image generation are performed in the near field of small phase objects using 3 cm microwave interferometers and a tapered open rectangular waveguide as near field probe. Measured field distributions are compared with moment method calculations, including probe scattering. A good agreement is obtained.

Citation Download Citation

Michael Totzeck "Effect of probe scattering on near field optical imaging of small phase objects: microwave measurements and numerical simulation", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 19832D (26 July 1993); https://doi.org/10.1117/12.2308504

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