512 x 512 frame transfer and storage imaging device with tin oxide gates and open-pinned phase technology

Robert Thomas Tacka; Leroy C. Colquitt; Bron R. Frias; Eric S. Juergensen; Arlene A. Santos; Eugene V. Thompson; Alfred P. Turley

doi:10.1117/12.161420

15 November 1993 512 x 512 frame transfer and storage imaging device with tin oxide gates and open-pinned phase technology

Robert Thomas Tacka, Leroy C. Colquitt, Bron R. Frias, Eric S. Juergensen, Arlene A. Santos, Eugene V. Thompson, Alfred P. Turley

Author Affiliations +

Proceedings Volume 1952, Surveillance Technologies and Imaging Components; (1993) https://doi.org/10.1117/12.161420
Event: Optical Engineering and Photonics in Aerospace Sensing, 1993, Orlando, FL, United States

Abstract

A versatile high performance Frame Transfer and Storage imaging device has been demonstrated using tin oxide gates and Open Pinned Phase (OPP) technology. The device consists of a 512 X 512 imaging array and integral 512 X 512 frame buffer. The detector size is 18 micrometers X 18 micrometers , however, pixel size is electronically controllable by detector aggregation in the X and Y directions. The use of tin oxide gates and OPP technology provide a front side illuminated device with high Quantum Efficiency and low leakage. This combination of features yields a mechanically robust high resolution imager, ideally suited for military, scientific, and commercial applications requiring high sensitivity and/or long stare times.

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Robert Thomas Tacka, Leroy C. Colquitt, Bron R. Frias, Eric S. Juergensen, Arlene A. Santos, Eugene V. Thompson, and Alfred P. Turley "512 x 512 frame transfer and storage imaging device with tin oxide gates and open-pinned phase technology", Proc. SPIE 1952, Surveillance Technologies and Imaging Components, (15 November 1993); https://doi.org/10.1117/12.161420

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