Scatterplate Interferometry

Lawrence F. Rubin

doi:10.1117/12.957833

25 December 1979 Scatterplate Interferometry

Lawrence F. Rubin

Proceedings Volume 0192, Interferometry; (1979) https://doi.org/10.1117/12.957833
Event: 23rd Annual Technical Symposium, 1979, San Diego, United States

Abstract

A Fourier optics approach is used to explain both the fabrication and theory of operation of a scatterplate interferometer. With these principles in mind, an understanding of the limitations and tolerances of the interferometer can be achieved. Some of these include limitations on the f/No. of the test system, quality of auxiliary optics, and tolerance on the scatterplate flip symmetry.

Citation Download Citation

Lawrence F. Rubin "Scatterplate Interferometry", Proc. SPIE 0192, Interferometry, (25 December 1979); https://doi.org/10.1117/12.957833

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