Mapping of microstructural surface changes by phase-shifting electronic speckle pattern interferometry

Gerd Guelker; Klaus D. Hinsch; Claudia Hoelscher

doi:10.1117/12.145538

28 May 1993 Mapping of microstructural surface changes by phase-shifting electronic speckle pattern interferometry

Gerd Guelker, Klaus D. Hinsch, Claudia Hoelscher

Proceedings Volume 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing; (1993) https://doi.org/10.1117/12.145538
Event: Applications in Optical Science and Engineering, 1992, Boston, MA, United States

Abstract

Electronic speckle pattern interferometry is elaborated in such a way that also spatially resolved image decorrelation can be measured. While retaining the typical ESPI setup for deformation measurements, a speckle correlation formalism is implemented based on the phase-shift method. In many practical situations decorrelation is directly related to surface microstructure changes of a test specimen. Feasibility and restrictions of the method are illustrated by measurements of water-induced changes at the surfaces of natural stones and by monitoring microbiological activity on stones.

Citation Download Citation

Gerd Guelker, Klaus D. Hinsch, and Claudia Hoelscher "Mapping of microstructural surface changes by phase-shifting electronic speckle pattern interferometry", Proc. SPIE 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing, (28 May 1993); https://doi.org/10.1117/12.145538

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