Paper
7 December 1992 Planar TiO2 waveguides by the sol-gel process: the relationship of structure to properties
Mohammed Bahtat, Jacques Mugnier, Liren Lou, Jean Serughetti
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Abstract
Recent works in our laboratories investigated the microstructure of titania films prepared from a colloidal solution and used as planar waveguides. The transmission electron microscopy including high resolution observations together with waveguide Raman spectroscopy, especially in the very low frequency range, showed a strong influence of the heat-treatment procedure on the films' morphology. In addition, atomic force microscopy provided valuable information on their surface roughness. At lower temperatures (450 degree(s)C), the films' structure consists of a mixture of amorphous TiO2 and anatase nanocrystals (4.5 - 5 nm) and its surface is smooth. On the contrary, when increasing the annealing temperature, the nanocrystals grow (50 nm at 1000 degree(s)C), pores (5 - 20 nm) are clearly distinguished and the films' waveguiding properties disappear. Here, we discuss the optical behavior of these films and its relationship to microstructure. It is clearly shown that a high degree of crystallization induces an important porosity, a rough surface and thus dramatically affects the films' waveguiding properties. Finally, we report a relatively simple strategy to stabilize the amorphous phase and control the crystallization in order to improve the optical quality of the waveguides.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mohammed Bahtat, Jacques Mugnier, Liren Lou, and Jean Serughetti "Planar TiO2 waveguides by the sol-gel process: the relationship of structure to properties", Proc. SPIE 1758, Sol-Gel Optics II, (7 December 1992); https://doi.org/10.1117/12.132011
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Cited by 22 scholarly publications.
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KEYWORDS
Annealing

Crystals

Waveguides

Silica

Raman spectroscopy

Raman scattering

Atomic force microscopy

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