Detection of surface microstructure changes by electronic speckle pattern interferometry

Gerd Guelker; Klaus D. Hinsch; Claudia Hoelscher

doi:10.1117/12.140435

2 March 1993 Detection of surface microstructure changes by electronic speckle pattern interferometry

Gerd Guelker, Klaus D. Hinsch, Claudia Hoelscher

Proceedings Volume 1732, Holographics International '92; (1993) https://doi.org/10.1117/12.140435
Event: Holographics International '92, 1992, London, United Kingdom

Abstract

An extension of a common electronic speckle pattern interferometry system is presented, which in addition to deformation measurements enables the spatially resolved quantitative determination of image decorrelation. In the absence of other decorrelation effects this quantity is directly related to surface microstructure changes of test specimen. Without principal variations of a typical ESPI setup a speckle correlation formalism is implemented based on the phase-shift method. Feasibility and restrictions are illustrated in measurements of water-induced changes of natural stone surfaces.

Citation Download Citation

Gerd Guelker, Klaus D. Hinsch, and Claudia Hoelscher "Detection of surface microstructure changes by electronic speckle pattern interferometry", Proc. SPIE 1732, Holographics International '92, (2 March 1993); https://doi.org/10.1117/12.140435

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