Knowledge-based diagnostic problem solving and learning in the test area of electronics assembly manufacturing

S. Narayanan; Ashwin Ram; Sally M. Cohen; Christine M. Mitchell; T. Govindaraj

doi:10.1117/12.56876

1 March 1992 Knowledge-based diagnostic problem solving and learning in the test area of electronics assembly manufacturing

S. Narayanan, Ashwin Ram, Sally M. Cohen, Christine M. Mitchell, T. Govindaraj

Author Affiliations +

Proceedings Volume 1707, Applications of Artificial Intelligence X: Knowledge-Based Systems; (1992) https://doi.org/10.1117/12.56876
Event: Aerospace Sensing, 1992, Orlando, FL, United States

Abstract

A critical area in electronics assembly manufacturing is the test and repair area. Computerized decision aids at this area can facilitate enhanced system performance. A key to developing computer-based aids is gaining an understanding of the human problem solving process in the complex task of troubleshooting in electronics manufacturing. In this paper, we present a computational model of troubleshooting and learning in electronics assembly manufacturing. The model is based on a theory of knowledge representation, reasoning, and learning, which is grounded in observations of human problem solving. The theory provides a foundation for developing applications of AI in complex, real world domains.

Citation Download Citation

S. Narayanan, Ashwin Ram, Sally M. Cohen, Christine M. Mitchell, and T. Govindaraj "Knowledge-based diagnostic problem solving and learning in the test area of electronics assembly manufacturing", Proc. SPIE 1707, Applications of Artificial Intelligence X: Knowledge-Based Systems, (1 March 1992); https://doi.org/10.1117/12.56876

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