Study of the recombination mechanisms and carrier lifetimes in Hg0.8Cd0.2Te alloy

Jingxuan Yan; Xierong Hu; Jiaxiong Fang; Guosen Xu

doi:10.1117/12.137806

1 September 1992 Study of the recombination mechanisms and carrier lifetimes in Hg_0.8Cd_0.2Te alloy

Jingxuan Yan, Xierong Hu, Jiaxiong Fang, Guosen Xu

Proceedings Volume 1685, Infrared Detectors and Focal Plane Arrays II; (1992) https://doi.org/10.1117/12.137806
Event: Aerospace Sensing, 1992, Orlando, FL, United States

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Jingxuan Yan, Xierong Hu, Jiaxiong Fang, and Guosen Xu "Study of the recombination mechanisms and carrier lifetimes in Hg_0.8Cd_0.2Te alloy", Proc. SPIE 1685, Infrared Detectors and Focal Plane Arrays II, (1 September 1992); https://doi.org/10.1117/12.137806

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