Paper
1 July 1992 Buried-channel CCDs with high-charge transfer efficiency and large-charge capacity for low-temperature readout of long-wavelength infrared detectors
Ana Lise Lattes, Bor-Yeu Tsaur
Author Affiliations +
Abstract
Double ion implantation has been used to fabricate buried-channel CCDs that exhibit good charge transfer efficiency at temperatures down to 50 K while retaining large charge storage capacity. Monolithic IR focal plane arrays integrating such CCDs and Ge(x)Si(1-x)/Si heterojunction detectors show good imaging performance in both the 3-5 micron and 8-10 micron IR spectral bands.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ana Lise Lattes and Bor-Yeu Tsaur "Buried-channel CCDs with high-charge transfer efficiency and large-charge capacity for low-temperature readout of long-wavelength infrared detectors", Proc. SPIE 1684, Infrared Readout Electronics, (1 July 1992); https://doi.org/10.1117/12.60510
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KEYWORDS
Charge-coupled devices

Infrared imaging

Infrared radiation

Sensors

Thermography

Imaging systems

Infrared sensors

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