Paper
1 June 1992 Holographic mask-aligner
Francis S. M. Clube, Simon Gray, Massoud Hamidi, Basil Arthur Omar, Denis Struchen, Jean-Claude Tisserand
Author Affiliations +
Abstract
Total internal reflection holography permits high resolution, non-contact lithography over very large fields. A prototype lithographic system has been constructed employing scanning illumination, focus and alignment subsystems integrated onto a 4" wafer handling mechanism. Resolution down to 0.25u has been achieved with a present alignment capability of <1u. A fine alignment system under development has been demonstrated to be capable of <0.1u accuracy. The technology is well suited to many applications, including flat panel displays, DRAMs, surface acoustic wave devices and optical storage disks.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Francis S. M. Clube, Simon Gray, Massoud Hamidi, Basil Arthur Omar, Denis Struchen, and Jean-Claude Tisserand "Holographic mask-aligner", Proc. SPIE 1674, Optical/Laser Microlithography V, (1 June 1992); https://doi.org/10.1117/12.130368
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CITATIONS
Cited by 2 patents.
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KEYWORDS
Semiconducting wafers

Holography

Optical alignment

Photomasks

Holograms

Lithography

Optical lithography

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