Angular magnetoresistance of textured thin-film conductors

P. Berdahl

doi:10.1117/12.2321838

1 March 1992 Angular magnetoresistance of textured thin-film conductors

P. Berdahl

Proceedings Volume 1597, Progress in High-Temperature Superconducting Transistors and Other Devices II; (1992) https://doi.org/10.1117/12.2321838
Event: Microelectronic Processing Integration, 1991, San Jose, CA, United States

Abstract

The angular magnetoresistance technique is proving to be a highly useful tool for the characterization of texture in thin film and other conductors composed of high-T_c superconductors This qualitative technique identifies the predominant orientation of crystallites by resistance dips which occur as a sample is rotated in a magnetic field. These dips occurs when the magnetic field is aligned parallel to the copper-oxide planes. We give some illustrative examples of the technique. It is particularly useful when x-ray diffraction is difficult due to small sample size, coating on the sample, or degeneracy of x-ray diffraction peaks.

Citation Download Citation

P. Berdahl "Angular magnetoresistance of textured thin-film conductors", Proc. SPIE 1597, Progress in High-Temperature Superconducting Transistors and Other Devices II, (1 March 1992); https://doi.org/10.1117/12.2321838

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