Automated characterization of Z-technology sensor modules

Andrew S. Gilcrest

doi:10.1117/12.49339

1 November 1991 Automated characterization of Z-technology sensor modules

Andrew S. Gilcrest

Proceedings Volume 1541, Infrared Sensors: Detectors, Electronics, and Signal Processing; (1991) https://doi.org/10.1117/12.49339
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

Detailed radiometric characterization data must be reviewed at the module level(2048 JR detectors) prior to integrating the hardware into higher level assemblies. Software has been developed that highly automates the process of reducing test data for noise, responsivity, uniformity, output offset, saturation, linearity, filter pole location, and crosstalk. Output consists of both text and graphics at different levels of detail in order to accommodate the needs of engineering, test, manufacturing, quality assurance, and program management. All the results are placed on a LAN so that the necessary reviews can occur in essentially a paperless environment.

Citation Download Citation

Andrew S. Gilcrest "Automated characterization of Z-technology sensor modules", Proc. SPIE 1541, Infrared Sensors: Detectors, Electronics, and Signal Processing, (1 November 1991); https://doi.org/10.1117/12.49339

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