Staring sensor MRT measurement and modeling

Jonathan Martin Mooney

doi:10.1117/12.48782

1 December 1991 Staring sensor MRT measurement and modeling

Jonathan Martin Mooney

Proceedings Volume 1540, Infrared Technology XVII; (1991) https://doi.org/10.1117/12.48782
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

The development of staring infrared focal plane arrays has forced potential users to consider the effect of spatial noise on the performance of infrared sensors. In this work, we varied the amount of spatial noise present in infrared imagery and measured its effect on the value of the minimum resolvable temperature (MRT). A mathematical model for including the effects of spatial noise on image quality is presented and compared to experimental data.

Citation Download Citation

Jonathan Martin Mooney "Staring sensor MRT measurement and modeling", Proc. SPIE 1540, Infrared Technology XVII, (1 December 1991); https://doi.org/10.1117/12.48782

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